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Quality Inspection of Printed Circuit Board Pin Insertion via Semantic Segmentation and Board-Level Feature Extraction

Authors

Do you know Nils Rabeneck?You can claim authorship or link another user.Do you know André Kiunke?You can claim authorship or link another user.Do you know Nicole Hoess?You can claim authorship or link another user.Do you know Wolfgang Mauerer?You can claim authorship or link another user.

Abstract

Quality control during printed circuit board (PCB) assembly is a critical step in ensuring reliable electronic products. Detecting misaligned pins during or after pin insertion remains a particularly challenging inspection task. This paper presents an automated defect detection method for identifying incorrectly inserted pins on PCBs. The proposed pipeline combines semantic segmentation using a U-Net architecture with contour-based feature extraction and logistic regression for board-level pass/fail classification. Segmentation masks are used to derive contour representations of individual pins, from which board-level features -such as average contour size- are extracted and used to train a logistic regression classifier. We evaluate the method on two datasets: an industrial collection of real-world PCB images, and a publicly available PCB pin-inspection dataset with substantially different visual characteristics. To assess the effectiveness of the proposed approach, a comparison against PatchCore, an anomaly detection technique new to be applied to pin inspection, as well as instance segmentation-based pin detection is made. The developed method achieved Area Under the Receiver Operating Characteristic Curve (ROC-AUC) values of 0.990 on a random test set split from the industrial data and 1.000 on the public dataset indicating strong separation between pass and fail boards. The results indicate that the proposed approach is a promising candidate for automated pin inspection in industrial environments and achieves strong performance on datasets with substantially different visual characteristics after dataset-specific training.

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