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GuidedFlow: An Attention-Guided Framework for Anomaly Detection in Additive Manufacturing

Authors

Do you know Sosmita Paul?You can claim authorship or link another user.Do you know Krishna Roy?You can claim authorship or link another user.

Abstract

Additive Manufacturing (AM) plays a vital role in the ongoing industrial revolution. However, quality control remains crucial and challenging due to printing defects or potential cyber-physical intrusions. Image or video-based anomaly detection is a key effort towards addressing these challenges. Various approaches have been explored in this domain, including reconstruction-based, embedding-based, and flow-based methods. Though normalizing flow-based methods address some of the core challenges of unforeseen defects and generalization while maintaining detection performance, existing approaches struggle with tiny/stringing defects common in 3D printing. In a small-data setting, this poses a limitation in generalization. To address these limitations, we propose \textbf{GuidedFlow}, a novel attention-guided normalizing flow model for anomaly detection and localization. GuidedFlow employs a pre-trained ResNet model, fine-tuned on the domain dataset. An attention-guided spatial and temporal flow framework models the dynamics across multiple scales and frames. A Spatio-Temporal Attention Network (SAN) enables the flow model to prioritize relevant contextual cues from input frames. We evaluate GuidedFlow on our AM3D-AD dataset, consisting of benign and anomalous real 3D printed object images and videos. We also conduct a comparative study using the MVTec-AD industrial image anomaly detection dataset. Experimental results demonstrate that GuidedFlow outperforms most of the state-of-the-art models with enhanced detection accuracy and AUROC.

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Publication notes

Journal
Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshop 2026