MEGA Hub

Precise Top-Layer Fabric Segmentation for Fabric Destacking with Edge- and Shape-Aware Deep Networks

Authors

Do you know Wenbo Dong?You can claim authorship or link another user.Do you know Dipankar Bhattacharya?You can claim authorship or link another user.Do you know Akinari Kobayashi?You can claim authorship or link another user.Do you know Akira Seino?You can claim authorship or link another user.Do you know Fuyuki Tokuda?You can claim authorship or link another user.Do you know Xuzhao Huang?You can claim authorship or link another user.Do you know Kai Tang?You can claim authorship or link another user.Do you know Norman C. Tien?You can claim authorship or link another user.Do you know Kazuhiro Kosuge?You can claim authorship or link another user.

Abstract

Fabric destacking requires precise segmentation of the topmost fabric layer, a task complicated by subtle fabric boundaries and high visual similarity between fabric layers. Existing semantic and edge-based segmentation approaches often struggle with these complexities, limiting the performance of robotic manipulation for different tasks. In this work, a novel segmentation training architecture tailored for top-layer fabric segmentation in stacked fabrics is proposed. The method extends the classical encoder-decoder framework by introducing two specialized branches - an edge-aware branch and a shape-aware branch - that are used to supervise the backbone network for better tuning. The edge-aware branch enhances boundary delineation, while the shape-aware branch guides the network to capture and align the overall fabric shape with reference masks derived from Computer Aided Design (CAD) models. Experiments on a real-world fabric dataset demonstrate that the training approach outperforms established baselines, verifying the effectiveness of the multi-branch design through both quantitative results and ablation studies.

Community

00

Publication notes

Author note
7 pages, 3 figures. Published in IEEE ICMA 2025. Author's accepted manuscript. Code: https://github.com/bhattner143/top-layer-fab-seg
Journal
2025 IEEE International Conference on Mechatronics and Automation (ICMA), Beijing, China, Aug. 2025
DOI
10.1109/ICMA65362.2025.11120697